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Research Article Open access CC BY 4.0

Wire Shorting Elimination through Wirebond Process Optimization of Semiconductor Sensor Device

Anthony Moreno, Edwin Graycochea Jr., Frederick Ray Gomez

Journal of Engineering Research and Reports · pp. 10–14 · Published 22 Jun 2020

10.9734/jerr/2020/v13i417108

Abstract

New and upcoming semiconductor devices and technologies are getting more challenging in assembly manufacturing process due to many factors such as complex package layout, process capability and critical bill of materials. This paper focused on the mitigation of the top major assembly reject of a semiconductor sensor device, that is the wire-to-wire shorting issue at wirebonding process. Parameter optimization particularly the looping segment 1 parameter, as well as using a reverse stitch on ball (RSOB) were employed to eliminate the wire-to-wire defect in wirebonding process. Finally, with the process optimization and improvement, a reduction of 98 percent wire-to-wire shorting occurrence was attained.

Wirebonding wire-to-wire short process improvement semiconductor assembly

Cited by 7

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Ball Crack Mitigation through Wirebond Process Optimization

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Enhanced Loop Height Optimization for Complex Configuration on QFN Device

A. Moreno, F. Gomez, E. Graycochea · Electronic Packaging Technology Conference · 2020

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