A Systematic Approach to Reduce Wirebond defects caused by Tight Wire Loop Profile on Ball Grid Array Packages
Irish Beltran, Mark Anthony Ramiro, Jerome Dinglasan
Journal of Engineering Research and Reports · pp. 27–34 · Published 8 Mar 2022
10.9734/jerr/2022/v22i217522Abstract
Wirebond quality aspects on a semiconductor manufacturing is one of the key factors to be considered in having a robust product. Certain criteria are defined, met, and affects the output on the product. Other variables from downstream process are also taken in account to affect the response, specific die position or placement on die attach is one example. Without controlling this input factor, unwanted out of specification response will occur and may result to rejections on the next process. This paper will focus on how to address the wire tight loop on wire bond process by analyzing the problem through systematic approach using statistical tools improving the current performance of die placement on BGA products.
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