Die Attach Process Analysis of Enhanced Stand-off Stopper on Tapeless Leadframe
E. Graycochea Jr., F. Gomez, R. Rodriguez, B. Bacquian
Journal of Engineering Research and Reports · pp. 22–26 · Published 13 Mar 2020
10.9734/jerr/2020/v11i117051Abstract
Improvement on the process and design is often a reliable way to resolve a problem especially in semiconductor industry. This paper presents a leadframe or semiconductor carrier merged with a stand-off design structure that will maintain a consistent bond line thickness (BLT) criteria for quad-flat no-leads (QFN) packages. Through package and process conceptualization, the stand-off design located on the leadframe underneath the silicon die corners would result to a steady and consistent BLT during die attach process. With the improved design, die tilt occurrence in die attach process would be mitigated.
References (6)
- 1 Handbook of Semiconductor Manufacturing Technology [DOI]
- 2 Printed Circuits Handbook
- 3 Die attach capability on ultra thin wafer thickness for power semiconductor [DOI]
- 4 Solder Paste in Electronics Packaging: Technology and Applications in Surface Mount, Hybrid Circuits, and Component Assembly
- 5 Pick and Place Process Optimization for Thin Semiconductor Packages [DOI]
- 6 Semiconductor Manufacturing Handbook
Cited by 4
Rennier S. Rodriguez, Edwin M. Graycochea Jr, Rammil A. Seguido, Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2020
Antonio R. Sumagpang Jr., Frederick Ray I. Gomez, Edwin M. Graycochea Jr. · Journal of Engineering Research and Reports · 2020
Showing 2 of 4 known citations — external sources report more than can currently be individually listed.
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