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Research Article Open access CC BY 4.0

Wirebond Process Optimization through Stitch Relocation on QFN Package

A. Moreno, E. Graycochea Jr., F. R. Gomez

Journal of Engineering Research and Reports · pp. 26–30 · Published 2 Dec 2020

10.9734/jerr/2020/v19i217228

Abstract

One of the most challenging assembly manufacturing process in semiconductor industry is wirebond process using a wire as direct material. With this new technology, some issues were encountered during the first trial of a quad flat no-leads (QFN) package. This paper is focused on the heal crack seen on the stitch formation during second bond. A comprehensive improvement was done by relocating the stitch formation on the second bond. Ultimately, heal crack occurrence was successfully eliminated.

Heal crack leadframe QFN stitch formation wirebonding.

References (6)

  1. 1 Handbook of Semiconductor Manufacturing Technology [DOI]
  2. 2 Trend of semiconductor packaging, high density and low cost [DOI]
  3. 3 Meeting the assembly challenges in new semiconductor packaging trend [DOI]
  4. 4 Wirebond Process Improvement with Enhanced Stand-off Bias Wire Clamp and Top Plate [DOI]
  5. 5 Wire Shorting Elimination through Wirebond Process Optimization of Semiconductor Sensor Device [DOI]
  6. 6 Non-stick on Pad Defect Reduction through Clamp and Insert Design Augmentation [DOI]

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