Understanding X-ray Crystallographic Diffraction of L-menthol by Rietveld Refinement: Insight into Structural Symmetry and Lattice Volume

Abstract

Highlighted the recent advances in the mechanism of crystallographic bibliography of L-Menthol crystals and to provide an overview of its application explored as well as its structural symmetry and lattice volume performance. The crystallographic analysis was explored by the X-ray diffraction (XRD) technique, and the surface morphology of L-Menthol crystals was depicted by polarized microscopic examination. The materials are composed of 100 % L-Menthol crystals and calculated lattice parameters a=b= 21.29Å, c= 6.038Å and angles α=β= 90° and γ= 120° for the hexagonal crystal system by Rietveld refinement. The crystallite sizes were calculated in Williamson-Hall plot 55.2 nm, Monshi-Scherrer model 58.3 nm, Size-strain plot model 66.1 nm, and Halder-Wagner model 62.5 nm; and the Scherrer model expressed at 63.03 nm. The calculated crystal strain is 0.256 %. The lower crystal strain suggests high stability of the phase in L-Menthol and mechanical properties. Lowering lattice volume 2371.126 ų in a structure typically refers to reducing the amount of material used to create a lattice structure of L-Menthol, often while maintaining or improving desired mechanical properties. The crystals exhibit a well-defined, hexagonal morphology with smooth, flat surfaces and sharp edges, which is characteristic of hexagonal L-Menthol crystals revealed by microscopic examination.