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Jerome J. Dinglasan

Publications (7)

Machine Capability Enhancement to Address Lacking Epoxy Coverage during Die Attach Process of QFN Packages

Jerome J. Dinglasan · Journal of Engineering Research and Reports · 2022

Epoxy coverage on die attach process is one of the important characteristics of a QFN semiconductor product. Epoxy condition on a die contributes to the product performance physically and electrically. Complete epoxy coverage satisfies the manufacturing requirement and resulting...

Open access Research Article 10.9734/jerr/2022/v22i1017569

Defining an Optimized Machine Process Sequence to Address Broken Wafer Phenomenon on Semiconductor Products

Jerome J. Dinglasan · Journal of Engineering Research and Reports · 2021

Silicon wafer as a direct material is one of the vital parts of a semiconductor product. Wastages on manufacturing plants that pulls the yield down should be addressed innovatively and accurately. This paper focused on the phenomenon of broken wafers at wafer taping process durin...

Open access Research Article 10.9734/jerr/2021/v20i817356

A Robust Approach of Maintaining Epoxy Position on Die Attach Process of Tapeless QFN Packages

Jerome J. Dinglasan, Leandro D. Saria & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2021

Epoxy quality contributes a great role in defining quality products of quad flat no lead multi row packages. In dealing with certain problems related to epoxy position shift caused by unoptimized design, innovation on the dispenser module is considered and focused at. This paper...

Open access Research Article 10.9734/jerr/2021/v20i617333

Conceptualized Improvement on Transparent Glass Die for a Robust Manufacturing Process

Jerome J. Dinglasan, Frederick Ray I. Gomez & Alyssa Grace S. Gablan · Journal of Engineering Research and Reports · 2021

Glass die are one of the materials used by semiconductor plants during production of specialized quad-flat no-leads (QFN) products. With its transparent appearance and fragile characteristics, several challenges are encountered and analyzed to resolve unwanted issues and to have...

Open access Research Article 10.9734/jerr/2021/v20i617326

Die Attach Process Robustness through Epoxy Pattern Optimization for DFN Device

Jerome J. Dinglasan & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2021

As the modern world evolves through innovation and technology, manufacturing companies of semiconductor drive their people to dedicate themselves on continuous improvement and technical advancement. Products they produce becomes smaller and thinner, but applications are limitless...

Open access Research Article 10.9734/jerr/2021/v20i517313

Digital Exhaust Controller for Pressure Detection on Die Attach Oven Curing Machine

Rogel Dela Rosa, Jerome J. Dinglasan & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

Innovation on die attach curing process on semiconductor industry play a big role to have a robust process eliminating unwanted gross unit rejection. Resolving failures and hardware breakdowns on the exhaust system of oven curing process are the focus of this paper. Discoloration...

Open access Research Article 10.9734/jerr/2021/v20i1117406

Innovative and Robust Application of Automation for Unit Level Traceability on Dual Die configuration of Micro Electromechanical System Products

Cheryl Jallorina, Mary Grace Tapia & Jerome J. Dinglasan · Journal of Engineering Research and Reports · 2021

Strip mapping for unit level traceability on die attach process of semiconductor companies provide quality driven impression for end users on the market. On processing of Micro electromechanical system packages, strip map generated by operators manually, certain errors and discre...

Open access Research Article 10.9734/jerr/2021/v21i517464