Chong Chen

Study on the Flexoelectricity of BST Film Multilayer Structure

Chong Chen · Journal of Scientific Research and Reports · 2020

Single layer and bilayer Y3+-doped Ba0.65Sr0.35TiO3 (BST) thin-film cantilever beam, of which the single BST film thickness is 500 nm, was prepared on a composite silicon substrate. The flexoelectric coefficients of both types of BSTs were measured using a low frequency vibration...