Innovative and Robust Application of Automation for Unit Level Traceability on Dual Die configuration of Micro Electromechanical System Products
Cheryl Jallorina, Mary Grace Tapia & Jerome J. Dinglasan · Journal of Engineering Research and Reports · 2021
Strip mapping for unit level traceability on die attach process of semiconductor companies provide quality driven impression for end users on the market. On processing of Micro electromechanical system packages, strip map generated by operators manually, certain errors and discre...
Open access
Research Article
10.9734/jerr/2021/v21i517464