Investigation of an Increase in Frequency of Scattered X-rays from a Silicon Single Crystal
Biswajit Mallick · Physical Science International Journal · 2013
Aims: X-ray scattered from a silicon single crystal was investigated. A new scattered line with increased frequency was observed. Study Design: In order to ascertain that the new modified X-ray line observed is not accidental, an inelastic scattering experiment has been perfo...
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Research Article