Diabetic Retinopathy (DR) remains one of the most common causes of preventable blindness worldwide, particularly among working-age adults between 20 and 64 years of age. Despite its prevalence, early diagnosis continues to be a significant clinical challenge because the disease f...
Open access
Research Article10.9734/cjast/2026/v45i54690
Wafer defect maps serve as a primary diagnostic tool for process engineers, enabling the visualization of spatial defect distributions and the identification of potential equipment or process issues. As technology nodes shrink and device densities increase, the volume of inspecti...
Open access
Research Article10.9734/ajarr/2026/v20i31302
The semiconductor industry faces increasing demands for precise and efficient wafer defect detection as device miniaturisation continues. Traditional manual inspection methods have proven inadequate for modern high-density wafer manufacturing, necessitating automated detection so...
Open access
Research Article10.9734/cjast/2026/v45i24668
Traditional Die-to-Die (D2D) inspection methods struggle to detect systematic and die-repeating defects that commonly occur in advanced semiconductor manufacturing nodes. To address these limitations, this work proposes a hybrid Die-to-Database (D2DB) inspection framework that br...
Open access
Research Article10.9734/cjast/2025/v44i124644
The semiconductor manufacturing industry demands increasingly sophisticated quality control mechanisms as device miniaturization approaches atomic scales. Wafer defect detection, a critical component of semiconductor fabrication, has undergone significant transformation with the...
Open access
Research Article10.9734/cjast/2025/v44i124637
The continuous downscaling of semiconductor feature sizes and the introduction of complex multilayer architectures have made wafer defect detection increasingly critical to maintaining high device yield and process stability. Conventional automated inspection systems that rely on...
Open access
Research Article10.9734/cjast/2025/v44i114633